Reduced dopant-induced scattering in remote charge-transfer-doped MoS2 field-effect transistors

Authors

Juntae Jang1, Jae-Keun Kim2, Jiwon Shin1, Jaeyoung Kim1, Kyeong-Yoon Baek1,Jaehyoung Park1, Seungmin Park3, Young Duck Kim3, Stuart S. P. Parkin2, Keehoon Kang4,5*,Kyungjune Cho6*, Takhee Lee1,5* 

Journal: Science Advances

Published date: 2022.09

https://www.science.org/doi/full/10.1126/sciadv.abn3181